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Magnetic Polishing System

PACE Technologies’ magnetic polishing system streamlines sample preparation by combining magnetic-backed polishing pads with durable magnetic baseplates. This flexible setup allows for quick pad changes and reliable flatness, all while maintaining precise control across both rough and final polishing stages. Compatible with alumina, diamond, and colloidal silica suspensions, our magnetic system is optimized for high-throughput metallography labs and research facilities.

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Introduction Pad Selection Guideline Process Description Recommended Procedures

Introduction

Selecting the right metallographic polishing pad is essential for achieving precise, repeatable surface finishes in sample preparation. Pads vary in nap height, backing type, and material composition, which impacts abrasive support, flatness, and edge retention. Low-napped pads paired with diamond abrasives are used in rough polishing to remove grinding damage, while high-napped cloths and fine abrasives like alumina or colloidal silica are ideal for final polishing. Choosing the correct pad minimizes artifacts such as edge rounding, relief, and smear, ensuring accurate microstructural analysis.

Polishing Pad (MAG) Selection Guideline

Pad Image & Link Use Case Pad Icon Polishing Stage
CERMESH CERMESH metal mesh pad used for semi-fixed abrasive coarse to intermediate lapping. Excellent for initial removal of damage from sectioning and hard materials. CERMESH icon Coarse / Intermediate
POLYPAD POLYPAD is a durable synthetic polyester pad ideal for intermediate polishing, especially with 6–15 µm diamond abrasives. Designed as a long-life nylon alternative. POLYPAD icon Intermediate
TEXPAN TEXPAN is a widely used non-woven intermediate polishing pad, compatible with most diamond suspensions. Effective across a broad range of materials. TEXPAN icon Intermediate
Black CHEM 2 Black CHEM 2 is a porometric polymer pad with rubber-like consistency, offering balanced action between low and high nap pads. Ideal for moderate nap intermediate polishing. Black CHEM 2 icon Intermediate
DACRON II DACRON II is a low-napped soft polishing pad widely used in Europe for intermediate steps on metals. Suitable for 1–15 µm diamond abrasives. DACRON icon Intermediate
NYPAD NYPAD is a low-napped silk pad tailored for intermediate polishing of harder metals and alloys. Performs well with mid-size diamond abrasives. NYPAD icon Intermediate
GOLD PAD GOLD PAD is a low-napped pad ideal for 1–9 µm polishing. Designed for consistent material removal and flatness control during final pre-polishing. GOLD PAD icon Intermediate
ATLANTIS ATLANTIS is a woven low-nap final polishing pad with foam backing for enhanced compliance. Ideal for 1–6 µm diamond. Great for critical surface flatness needs. ATLANTIS icon Final
MICROPAD MICROPAD is a high-napped final polishing pad ideal for producing a mirror finish on metals and polymers. Recommended for <1 µm diamond or colloidal silica. MICROPAD icon Final
TRICOTE TRICOTE is a tight high-napped final polishing pad for metals. Offers better control of surface texture and minimal abrasive drag. TRICOTE icon Final
NAPPAD NAPPAD is a very high-napped final polishing pad tailored for soft metals and polymers. Provides gentle polishing action to minimize pull-out and relief. NAPPAD icon Final
MOLTEC 2 MOLTEC 2 is a wool-based final polishing cloth used when edge retention is not critical. Works well with alumina and colloidal silica on metals. MOLTEC icon Final
FELT PAD FELT PAD is a thick final polishing pad made for large samples or glass. Ideal for use with colloidal silica or alumina slurries where surface uniformity is key. FELT PAD icon Final
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Process Description

Polishing typically involves two stages: rough and final. Rough polishing removes deformation from grinding using low-napped pads and polycrystalline diamond abrasives. Final polishing uses high-napped cloths and finer abrasives such as alumina or colloidal silica to eliminate minor defects.


Using magnetic-backed pads simplifies transitions between stages and ensures consistent flatness due to firm, uniform adhesion across the platen. This stability minimizes polishing artifacts and helps maintain process control across multiple specimens.


Excessive polishing can cause artifacts like relief, edge rounding, and smear, so polishing time should be minimized.


Minimizing Polishing Artifacts

To reduce edge rounding, phase relief, smear, and grain pull-out:

A flat plate prevents uneven pressure that leads to polishing relief. When using magnetic baseplates, ensure proper cleaning between pad swaps to preserve flat contact and long-term performance.

Recommended Procedures

Troubleshooting

Symptom Cause Solution
Coarse Scratching Contamination on polishing pad Replace pad with a clean magnetic-backed version
Tearing of Pad Excessive force or poor lubrication Reduce force; improve lubrication and ensure full pad contact on magnet
Pad Slipping or Lifting Contaminated baseplate or warped pad Clean baseplate surface thoroughly; ensure pad is flat and undamaged
Excessive Relief / Edge Rounding Improper pad selection or prolonged polishing Use suitable nap pad; minimize final polish duration and verify flatness